OPTIMIZATION-BASED MULTIFREQUENCY TEST-GENERATION FOR ANALOG CIRCUITS

A robust test set for analog circuits has to detect faults under maxim al masking effects due to variations of circuit parameters in their to lerance box. In this paper we propose an optimization based multifrequ ency test generation method for detecting parametric faults in linear analog circuits. Given a set of performances and a frequency range, ou r approach selects the test frequencies that maximize the observabilit y on a circuit performance of a parameter deviation under the worst ma sking effects of normal variations of the other parameters. Experiment al results are provided and validated by HSpice simulations to illustr ate the proposed approach.