A GENERAL-PURPOSE DESIGN-FOR-TEST METHODOLOGY AT THE ANALOG-DIGITAL BOUNDARY OF MIXED-SIGNAL VLSI

Authors
VERFAILLIE J HASPESLAGH D
Citation
J. Verfaillie et D. Haspeslagh, A GENERAL-PURPOSE DESIGN-FOR-TEST METHODOLOGY AT THE ANALOG-DIGITAL BOUNDARY OF MIXED-SIGNAL VLSI, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 9(1-2), 1996, pp. 109-115
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS → ACNP
ISSN journal
09238174
Volume
9
Issue
1-2
Year of publication
1996
Pages
109 - 115
Database
ISI
SICI code
0923-8174(1996)9:1-2<109:AGDMAT>2.0.ZU;2-H
Abstract
A general-purpose modular-based scan chain between the analog-digital boundary of a mixed analog/digital design is proposed. This general-pu rpose Design-For-Test methodology is oriented towards the test of the mixed-signal modules within the design. Implementing this structure im proves the controllability and observability of these modules and the reusability of the test software at a minimum cost.