J. Verfaillie et D. Haspeslagh, A GENERAL-PURPOSE DESIGN-FOR-TEST METHODOLOGY AT THE ANALOG-DIGITAL BOUNDARY OF MIXED-SIGNAL VLSI, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 9(1-2), 1996, pp. 109-115
A general-purpose modular-based scan chain between the analog-digital
boundary of a mixed analog/digital design is proposed. This general-pu
rpose Design-For-Test methodology is oriented towards the test of the
mixed-signal modules within the design. Implementing this structure im
proves the controllability and observability of these modules and the
reusability of the test software at a minimum cost.