2-LAYER BEHAVIOR DURING LOW-ENERGY ION ABLATION OF CDTE(001) STUDIED BY IN-SITU X-RAY-DIFFRACTION AND BY MONTE-CARLO SIMULATION

Authors
ETGENS VH RIBEIROTEIXEIRA RM MORS PM VERON MB TATARENKO S SAUVAGESIMKIN M ALVAREZ J FERRER S
Citation
Vh. Etgens et al., 2-LAYER BEHAVIOR DURING LOW-ENERGY ION ABLATION OF CDTE(001) STUDIED BY IN-SITU X-RAY-DIFFRACTION AND BY MONTE-CARLO SIMULATION, Europhysics letters, 36(4), 1996, pp. 271-276
Citations number
16
Categorie Soggetti
Physics
Journal title
Europhysics letters → ACNP
ISSN journal
02955075
Volume
36
Issue
4
Year of publication
1996
Pages
271 - 276
Database
ISI
SICI code
0295-5075(1996)36:4<271:2BDLIA>2.0.ZU;2-X
Abstract
The evolution of the CdTe(001) surface during ion bombardment was stud ied by grazing incidence X-ray diffraction (GIXD) and by Monte Carlo s imulation. A layer-by-layer removal was observed at 270 degrees C whic h evolves to a step-flow mode above 300 degrees C. An anisotropic rela xation of the surface lattice parameter and a long-distance correlatio n between islands along the [1-10] direction were observed during sput tering.