A digital image analysis system (DIAS) is described for evaluation of
etched nuclear damaged tracks in plastics. Early efforts were directed
at automated measurements of the ellipticity and area of etch tracks
in CR-39 track areas related to particle energy. Discrimination was ma
de between etch tracks from alpha particles emitted by Pu-239, Am-241
and Cm-244 with goad linearity of response for time of exposure. The D
IAS could also discriminate between etched alpha particle tracks and e
tched surface scratches and other chemical artefacts. Eventually, it i
s hoped to expand the image enhancement and shape discrimination capab
ilities to measure the size and activity of 'hot' alpha-emitting parti
cles.