MEASURING SURFACE STRESS-INDUCED BY ELECTRODE PROCESSES USING A MICROMECHANICAL SENSOR

Sensitive and fast sensors can be constructed from atomic force micros cope (AFM) cantilevers for studies of interfacial processes such as ad sorption and reconstruction. We have constructed a surface stress sens or with submonolayer sensitivity for use in electrochemistry, whereby simultaneous cyclic voltammograms and stress changes can be recorded. This is demonstrated with measurements of the electrocapillary curve o f gold, and the stress changes associated with the underpotential depo sition of silver on gold(111).