STUDY OF COPPER SULFIDE FILM FORMATION BY VOLTAMMETRY COMBINED WITH ELECTROCHEMICAL QUARTZ-CRYSTAL MICROGRAVIMETRY COULOMETRY AND OPTICAL SPECTROSCOPY/
Nr. Detacconi et al., STUDY OF COPPER SULFIDE FILM FORMATION BY VOLTAMMETRY COMBINED WITH ELECTROCHEMICAL QUARTZ-CRYSTAL MICROGRAVIMETRY COULOMETRY AND OPTICAL SPECTROSCOPY/, Journal of physical chemistry, 100(46), 1996, pp. 18234-18239
This paper describes a study of copper sulfide film formation at coppe
r anodes in sulfide-containing aqueous NaOH media. Voltammetry along w
ith combined electrochemical quartz crystal microgravimetry (EQCM)/cou
lometry showed the formation of an initial Cu2S (chalcocite) phase. Fu
rther oxidation resulted in a nonstoichiometric overlayer culminating
in a surface that was CuS (covellite) in composition. The EQCM data al
so revealed incipient dissolution of the copper surface in the alkalin
e sulfide media as Cu(I) species. Chemical sulfidization of the copper
surface is also shown to be an important film formation pathway. Comp
lementary spectroscopic data were obtained in situ by visible reflecta
nce spectroscopy and laser Raman spectroscopy. Ex situ analysis of the
copper sulfide layer composition by X-ray photoelectron spectroscopy
is also presented.