OBSERVATION OF INTERFERENCE EFFECTS DUE TO MULTIPLE REFLECTION OF FLUORESCENT X-RAYS IN AN ORGANIC THIN-FILM

An interference pattern of fluorescent x rays caused by multiple refle ction in a thin film has been observed. The fluorescent x rays emitted from a zinc monatomic layer embedded in an organic thin film on an x- ray reflecting mirror are reflected both at air-film and at film-mirro r interfaces. Interference due to multiple reflection appears at an an gular distribution of fluorescent x rays just above the critical angle for total reflection from the air-film interface. Position of atoms e mitting fluorescent x rays were determined by measuring interference p atterns.