Many textures such as woven fabrics and composites have a regular and
repeating texture. This paper presents a new method to capture the tex
ture information using adaptive wavelet bases. Wavelets are compact fu
nctions which can be used to generate a multiresolution analysis, Text
ure constraints are used to adapt the wavelets to better characterize
specific textures. An adapted wavelet basis has very high sensitivity
to the abrupt changes in the texture structure caused by defects. This
paper demonstrates how adaptive wavelet basis can be used to locate d
efects in woven fabrics. (C) 1996 Society of Photo-Optical Instrumenta
tion Engineers.