ABERRATIONS INTRODUCED IN OFF-AXIS TESTING OF SPHERICAL SURFACES

Authors
MALACARAHERNANDEZ D SERVIN M
Citation
D. Malacarahernandez et M. Servin, ABERRATIONS INTRODUCED IN OFF-AXIS TESTING OF SPHERICAL SURFACES, Optical engineering, 35(11), 1996, pp. 3260-3264
Citations number
6
Categorie Soggetti
Optics
Journal title
Optical engineering → ACNP
ISSN journal
00913286
Volume
35
Issue
11
Year of publication
1996
Pages
3260 - 3264
Database
ISI
SICI code
0091-3286(1996)35:11<3260:AIIOTO>2.0.ZU;2-N
Abstract
It is well known that off-axis testing of a spherical surface introduc es aberrations, mainly primary astigmatism. The magnitudes of these ab errations are discussed and analytically calculated. Their influence i n several testing configurations is discussed. A case of particular in terest is when a linear carrier fringe pattern is used in a Fizeau int erferometer. (C) 1996 Society of Photo-Optical Instrumentation Enginee rs.