Pc. Schlecht et al., LABORATORY AND ANALYTICAL METHOD PERFORMANCE OF LEAD MEASUREMENTS IN PAINT CHIPS, SOILS, AND DUSTS, American Industrial Hygiene Association journal, 57(11), 1996, pp. 1035-1043
The National Lead Laboratory Accreditation Program (NLLAP) recognizes
laboratories capable of analyzing lead in paints, soils, a nd dusts. N
LLAP requires successful participation in the Environ mental Lead Prof
iciency Analytical Testing (ELPAT) program. For paint chip analyses, l
aboratory-to-laboratory Health Service, Centers variability is about 1
0% relative standard deviation (RSD) for lead levels near 0.5%, the HU
D definition for Disease Control and of lead-based paint. For soil ana
lyses, RSDs are about 9 to 10% near relevant federal soil standards an
d 16% near the lowest state bare soil standard that currently exists.
For dust wipe analyses, RSDs range from 10 to 16% for lead levels near
relevant HUD standards. Of participating laboratories, 92 to 93% cons
istently meet ELPAT performance limits. A variety of analytical method
s gives similar results. No conclusive significant differences were fo
und among most frequently used hotplate and microwave sample preparati
on techniques. In addition, several participating laboratories have su
ccessfully used ultrasonic extraction methods, a method suitable far u
se at abatement sites. The three most frequently used instrumental tec
hniques, flame atomic absorption (FAA), inductively coupled plasma-ato
mic emission spectroscopy (ICP-AES), and graphite furnace atomic absor
ption show no statistically significant differences in ability to meet
ELPAT performance limits. However, small statistically significant bi
ases between these methods sometimes occur. The magnitude of biases is
less than 5% of the corresponding laboratory mean near relevant feder
al standards except for lead levels near the lowest HUD lead wipe stan
dard, where biases can be as high as 8%. Other instrumental methods th
at have been used successfully include ICP-mass spectroscopy,direct cu
rrent plasma-atomic emission spectroscopy, dithizone spectrophotometry
, and anodic stripping voltametry.