FREE-ELECTRON LASER WAVELENGTH-SELECTIVE MATERIALS ALTERATION AND PHOTOEXCITATION SPECTROSCOPY

Citation
Nh. Tolk et al., FREE-ELECTRON LASER WAVELENGTH-SELECTIVE MATERIALS ALTERATION AND PHOTOEXCITATION SPECTROSCOPY, Applied surface science, 106, 1996, pp. 205-210
Citations number
25
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
106
Year of publication
1996
Pages
205 - 210
Database
ISI
SICI code
0169-4332(1996)106:<205:FLWMAA>2.0.ZU;2-Z
Abstract
The free-electron laser (FEL) has become an important tool for produci ng high-intensity photon beams, especially in the infrared. Synchrotro n radiation's primary spectral domains are in the ultraviolet and X-ra y region. FEL's are therefore excellent complimentary facilities to sy nchrotron radiation sources. While FEL's have seen only limited use in experimentation, recently developed programs at Vanderbilt University in Jashville, TN, are swiftly rectifying this situation. This review paper examines practical experience obtained through pioneering progra ms using the Vanderbilt FEL, which currently hosts one of the largest FEL materials research programs. Results will be discussed in three ar eas: two-photon absorption in germanium, FEL-assisted internal photoem ission measurements of interface energy barriers (FELIPE), and wavelen gth-specific laser diamond ablation.