IMAGE-ANALYSIS OF STRUCTURAL-CHANGES IN LASER-IRRADIATED THIN-FILMS OF PHOTODEPOSITED A-SE

Write and erase features by the photodeposition effect have been accom plished in recent investigations. Quantitative analysis of the surface grains size and structure in the laser affected areas of the deposite d thin films is of importance to the understanding of the material sur face redistribution phenomena. Fractal dimensionality and 2D-Fourier s pectral analyses have been employed as the most straightforward quanti tative approaches connecting the change of grain size distribution wit h the driving forces involved in the formation of the grain shapes. Th ese approaches have been used since the irregular spatial shapes of th e mains cannot be approximated by simple or regular geometrical shapes of definite size. Hence, we use these two topological analysis method s for classifying the surface morphology in the various zones of the l aser beam written thin film.