SPECTROSCOPY AS IN-SITU DIAGNOSTICS FOR PULSED-LASER DEPOSITION OF SUPERCONDUCTIVE AND FERROELECTRIC THIN-FILMS

Citation
M. Allegrini et al., SPECTROSCOPY AS IN-SITU DIAGNOSTICS FOR PULSED-LASER DEPOSITION OF SUPERCONDUCTIVE AND FERROELECTRIC THIN-FILMS, Applied surface science, 106, 1996, pp. 438-446
Citations number
29
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
106
Year of publication
1996
Pages
438 - 446
Database
ISI
SICI code
0169-4332(1996)106:<438:SAIDFP>2.0.ZU;2-W
Abstract
We currently use optical spectroscopy as an in-situ diagnostic tool in the pulsed laser ablation and deposition of superconductive and ferro electric thin films. The emission from the ablated species is collecte d from both directions normal and parallel to the plume expansion axis . Space and time resolved measurements enable a quantitative evaluatio n of density and temperature of the plasma produced by the laser-plume interaction. This characterization of the plume in the early stages o f its expansion is important to understand the mechanisms responsible for the efficient laser-matter energy coupling typical of the pulsed l aser ablation and deposition process.