T. Ungar et A. Borbely, THE EFFECT OF DISLOCATION CONTRAST ON X-RAY-LINE BROADENING - A NEW APPROACH TO LINE-PROFILE ANALYSIS, Applied physics letters, 69(21), 1996, pp. 3173-3175
The x-ray line profiles of an ultrafine grained copper crystal, produc
ed by equal-channel angular pressing, were measured by a special high
resolution diffractometer with negligible instrumental line broadening
. The analysis of the line breadths and the Fourier coefficients have
shown that taking into account the contrast caused by dislocations on
line profiles gives new scaling factors in the Williamson-Hall plot an
d in the Warren-Averbach analysis, respectively. When strain is caused
by dislocations the new procedure proposed here enables a straightfor
ward determination of particle size and strain, the latter in terms of
the dislocation density. (C) 1996 American Institute of Physics.