In this letter, we describe the surface properties of GaN thin films g
rown on sapphire substrate by molecular beam epitaxy, as revealed by u
ltraviolet and x-ray photoelectron spectroscopic and Auger electron sp
ectroscopic studies. The samples are seen to contain overlayer of nati
ve oxides, which are predominantly in the Ga2O3 form. Ammonia is shown
to be a good etchant for these native oxides. Furthermore, we investi
gated the early stages of the reaction of monolayer Al with a GaN surf
ace covered with native oxide, Aluminum reacts preferentially with the
surface oxygen and leads to the formation of a mixture of oxides at t
he interface. (C) 1996 American institute of Physics.