Vm. Babich et al., ON THE NATURE OF DEEP DONORS CREATED AT 450-DEGREES-C IN BORON-DOPED P-SI, Physica status solidi. a, Applied research, 157(2), 1996, pp. 405-410
It is shown that the boron impurity in oxygen-rich p-Si is involved in
the formation of electrically active complexes: namely, deep thermal
donors, during thermal annealing at T = 450 degrees C. The conclusion
is based on experimental results obtained by several techniques such a
s Hall measurements, electron spin resonance, and photoluminescence.