ANALYSIS OF SNUBBER-CLAMPED DIODE-STRING MIXED VOLTAGE INTERFACE ESD PROTECTION NETWORK FOR ADVANCED MICROPROCESSORS (REPRINTED FROM ELECTRICAL OVERSTRESS ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS, 1995)

Authors
VOLDMAN SH GEROSA G GROSS VP DICKSON N FURKAY S SLINKMAN J
Citation
Sh. Voldman et al., ANALYSIS OF SNUBBER-CLAMPED DIODE-STRING MIXED VOLTAGE INTERFACE ESD PROTECTION NETWORK FOR ADVANCED MICROPROCESSORS (REPRINTED FROM ELECTRICAL OVERSTRESS ELECTROSTATIC DISCHARGE SYMPOSIUM PROCEEDINGS, 1995), Journal of electrostatics, 38(1-2), 1996, pp. 3-31
Citations number
25
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Journal of electrostatics → ACNP
ISSN journal
03043886
Volume
38
Issue
1-2
Year of publication
1996
Pages
3 - 31
Database
ISI
SICI code
0304-3886(1996)38:1-2<3:AOSDMV>2.0.ZU;2-S
Abstract
A novel snubber-clamped diode-string ESD protection circuit for mixed voltage interface microprocessor applications is described. Analytical models, circuit simulation, electrical characterization, ESD electrot hermal simulation, and ESD test data, will be shown for shallow trench isolation (STI) and LOCOS CMOS technologies.