MOLECULAR RESOLUTION IMAGING OF DEXTRAN MONOLAYERS IMMOBILIZED ON SILICA BY ATOMIC-FORCE MICROSCOPY

Citation
S. Tasker et al., MOLECULAR RESOLUTION IMAGING OF DEXTRAN MONOLAYERS IMMOBILIZED ON SILICA BY ATOMIC-FORCE MICROSCOPY, Langmuir, 12(26), 1996, pp. 6436-6442
Citations number
40
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
07437463
Volume
12
Issue
26
Year of publication
1996
Pages
6436 - 6442
Database
ISI
SICI code
0743-7463(1996)12:26<6436:MRIODM>2.0.ZU;2-1
Abstract
A range of dextrans (5, 10, and 70 kDa) were covalently bound to smoot h silica slides and porous (500 Angstrom) silica particles with an ext ernal diameter of 25 mu m. AFM analysis of the slides in air has shown the presence of discrete, clustered, and in a few regions overlayered dextran molecules, which exhibit increasing diameter and decreasing p acking densities with increasing molecular weight. Analysis of 10 and 70 kDa dextran bound to silica particles has revealed surface features consistent with those of the dextran molecules, superimposed upon the morphology of the underlying silica particle.