ELECTROCHEMICAL AND SCANNING FORCE MICROSCOPY CHARACTERIZATION OF FRACTAL PALLADIUM SURFACES RESULTING FROM THE ELECTROREDUCTION OF PALLADIUM OXIDE LAYERS
T. Kessler et al., ELECTROCHEMICAL AND SCANNING FORCE MICROSCOPY CHARACTERIZATION OF FRACTAL PALLADIUM SURFACES RESULTING FROM THE ELECTROREDUCTION OF PALLADIUM OXIDE LAYERS, Langmuir, 12(26), 1996, pp. 6587-6596
Pd oxide layers were grown by applying to smooth Pd electrodes a poten
tial reversal technique (PRT) in 1 M H2SO4 at 25 degrees C. The electr
oreduction of the Pd oxide layer was made either voltammetrically or p
otentiostatically, yielding a Pd overlayer with a large increase in su
rface area. The effective range of PRT conditions for increasing the P
d surface area was established. The increase in surface area of treate
d Pd was voltammetrically determined. The electrochemical behavior of
treated Pd electrodes in acid revealed an enhancement of the H atom su
rface electroadsorption processes. This behavior is consistent with th
e fractal characteristics of the treated Pd electrode surface, as demo
nstrated by the analysis of scanning force microscopy imaging data.