ELECTROCHEMICAL AND SCANNING FORCE MICROSCOPY CHARACTERIZATION OF FRACTAL PALLADIUM SURFACES RESULTING FROM THE ELECTROREDUCTION OF PALLADIUM OXIDE LAYERS

Citation
T. Kessler et al., ELECTROCHEMICAL AND SCANNING FORCE MICROSCOPY CHARACTERIZATION OF FRACTAL PALLADIUM SURFACES RESULTING FROM THE ELECTROREDUCTION OF PALLADIUM OXIDE LAYERS, Langmuir, 12(26), 1996, pp. 6587-6596
Citations number
60
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
07437463
Volume
12
Issue
26
Year of publication
1996
Pages
6587 - 6596
Database
ISI
SICI code
0743-7463(1996)12:26<6587:EASFMC>2.0.ZU;2-7
Abstract
Pd oxide layers were grown by applying to smooth Pd electrodes a poten tial reversal technique (PRT) in 1 M H2SO4 at 25 degrees C. The electr oreduction of the Pd oxide layer was made either voltammetrically or p otentiostatically, yielding a Pd overlayer with a large increase in su rface area. The effective range of PRT conditions for increasing the P d surface area was established. The increase in surface area of treate d Pd was voltammetrically determined. The electrochemical behavior of treated Pd electrodes in acid revealed an enhancement of the H atom su rface electroadsorption processes. This behavior is consistent with th e fractal characteristics of the treated Pd electrode surface, as demo nstrated by the analysis of scanning force microscopy imaging data.