HIGH-ENERGY REFOCUSED LAUE METHOD - ANALY TIC TECHNIQUE FOR VOLUMETRIC STUDY OF SINGLE-CRYSTALS

Citation
P. Bastie et B. Hamelin, HIGH-ENERGY REFOCUSED LAUE METHOD - ANALY TIC TECHNIQUE FOR VOLUMETRIC STUDY OF SINGLE-CRYSTALS, Journal de physique. IV, 6(C4), 1996, pp. 13-21
Citations number
11
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
6
Issue
C4
Year of publication
1996
Pages
13 - 21
Database
ISI
SICI code
1155-4339(1996)6:C4<13:HRLM-A>2.0.ZU;2-#
Abstract
Using high voltage X-ray generators (typically 400 kV) and two dimensi onal detectors from the industrial radiography, a variant of the Laue method has been transposed for high energy radiations. By this way. a laboratory diffractometer has been built which allows us to study bulk properties of large single crystals with thickness of several centime ters, practically in real time. The first results prove the feasibilit y and the sensitivity of the method, show possible uses of this techni que and open interesting opportunities for basic research such as phas e transition studies, for]age single crystal bulk characterisation and also non destructive testing.