Position sensitive curved detectors offers various advantages in XRD e
xperiments. However a specific calibration and measurement protocol is
required in order to achieve accurate results. To estimate the resolu
tion and reproducibility of the measurements, and to assess the shape
and size of the systematic deviations front the best linear calibratio
n of the detector setup, diffractograms were obtained on a standard mi
xture over a long period of time.