STUDY ON RESIDUAL-STRESSES IN MULTILAYERE D AU-NI MATERIALS

Multilayer materials appears today very studied in order to increase t hese physico-chemical characteristics. The determination of residual s tresses that occur during the elaboration of multilayers is very impor tant in the knowledge of these properties but also the metal/metal int erfaces one. This study uas made on Au/Ni multilayers obtained by mole cular beam epitaxy. Residual stress were determined by X-ray diffracti on using triaxial analysis of stresses and ''sin(2) psi'' method.