X-RAY-DIFFRACTION OF PVD TANTALUM COATING S

Citation
L. Chekour et al., X-RAY-DIFFRACTION OF PVD TANTALUM COATING S, Journal de physique. IV, 6(C4), 1996, pp. 251-258
Citations number
9
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
6
Issue
C4
Year of publication
1996
Pages
251 - 258
Database
ISI
SICI code
1155-4339(1996)6:C4<251:XOPTCS>2.0.ZU;2-6
Abstract
The aim of this study is to determine residual stresses in Ta thin PVD deposits on steel. The samples are then annealed between 600 and 1100 degrees C producing Ta carbides in the layer. These carbides increase the mechanical properties of the surface. They increase the compressi ve residual stresses in the Ta layer. Compressive stresses about 500 M Pa are measured without annealing and about 1500 MPa for a sample anne aled 1 hour at 1100 degrees C.