NEW METHOD FOR QUANTIFICATION OF CRYSTAL ORIENTATION BY ULTRARAPID HIGH-RESOLUTION POLE FIGURE TECHNIQUE

An improved method for texture characterization has been developed for heavy textured specimens (thin films, twins, single crystals, etc...) , using a new high resolution X-Ray pole figure technique with a high speed measurement. An adaptive hemispheric scanning and a data treatme nt using digital image processing has been implemented for both diffra ctometer correction and automatic texture quantification. This method is linked to anew high resolution FDOC determination associated with t he DOSOPHATEX system.