X-RAY MICROSCOPY BY TOTAL REFLECTIVITY AN D GRAZING-INCIDENCE KOSSEL DIFFRACTION

A scanning electron microscope has been modified by the addition of a CCD camera in order to acquire rapidly either projection X-ray microra diographies or transmission Kossel diffraction patterns. By changing t he relative position of the X-ray source and of the specimen with resp ect to the CCD camera, we show that it is also possible to obtain succ essively reflection diffraction patterns and also magnified topographi c images of the surface by X-ray total reflection.