MULTIPLE-SCATTERING CALCULATION OF ABSORPTION-SPECTRUM AND DIFFRACTION CALCULATION - APPLICATION TO NANOMETER-SCALE COPPER METALLIC PARTICLE

XAFS spectroscopy is a very efficient tool to describe local organisat ion and to determine the size and the lattice of nanometric metallic p articles which are major information regarding their electronic proper ties. Nevertheless, good accuracy is hard to obtain. In order to evalu ate the sensitivity of XANES (X-ray Absorption Near Edge Structure) an d WAXS (Wide Angle X-ray Scattering) techniques versus these structura l parameters, different multiple scattering (M.S.) calculations using either the NATOLI's code or the REHR's code have been performed for ve ry small metallic clusters of copper.