D. Bazin et al., MULTIPLE-SCATTERING CALCULATION OF ABSORPTION-SPECTRUM AND DIFFRACTION CALCULATION - APPLICATION TO NANOMETER-SCALE COPPER METALLIC PARTICLE, Journal de physique. IV, 6(C4), 1996, pp. 481-485
XAFS spectroscopy is a very efficient tool to describe local organisat
ion and to determine the size and the lattice of nanometric metallic p
articles which are major information regarding their electronic proper
ties. Nevertheless, good accuracy is hard to obtain. In order to evalu
ate the sensitivity of XANES (X-ray Absorption Near Edge Structure) an
d WAXS (Wide Angle X-ray Scattering) techniques versus these structura
l parameters, different multiple scattering (M.S.) calculations using
either the NATOLI's code or the REHR's code have been performed for ve
ry small metallic clusters of copper.