M. Bertucci et P. Zydowicz, ANALYSIS OF TRACE-ELEMENTS IN POLYVINYLID ENE FLUORIDE BY X-RAY-FLUORESCENCE AND INDUCTIVE COUPLING PLASMA-MASS SPECTROMETRY WITH AN ABLATION LASER, Journal de physique. IV, 6(C4), 1996, pp. 853-862
Trace element determination in Polyvinylidene fluoride (PVDF) has two
aims : a comparison of commercial products and quantitative data acqui
sition for the promotion of this technical polymer in the field of ele
ctronic high purity fluid transportation. X-ray Fluorescence XRF) and
laser ablation-Inductively Coupled Plasma Mass Spectrometry (ICP-MS) h
ave been used in order to replace the time consuming and likely to pol
lute (loss of volatiles or reagent contamination) wet chemistry analys
is. More than 25 elements have been measured, using synthetic calibrat
ion standards. This work outlines the complementarity of the two techn
iques. ICP-MS is particularly well suited for the measurement of trace
elements with atomic number higher than Ga (detection limits <1 ppm),
whereas x-ray fluorescence is well suited for the analysis of lower a
tomic number elements (detection limits lie in the low ppm range). The
results can be extrapolated to other polymers, thanks to the implemen
tation of x-ray fluorescence simulation programs.