J. Bakmisiuk et al., INFLUENCE OF REDISTRIBUTION OF ELECTRONS IN THE CONDUCTION-BAND ON THE LATTICE-PARAMETERS OF ALXGA1-XAS, Applied physics letters, 69(22), 1996, pp. 3366-3368
Lattice parameters of GaAs layers were measured using the Bond method.
For samples heavily doped with S and Se, we observed an increase of l
attice parameters with respect to the undoped samples. The results are
compared with those observed for AlxGa1-xAs:S (Wagner et al.)(12) and
both are explained by the influence of free electrons and their redis
tribution in the conduction band. For Al0.39Ga0.61As, the following va
lues of deformation potentials of the conduction-band minima were obta
ined: D-Gamma = - 6.7 eV, D-L = 1.4 eV, and D-X = 1 eV. (C) 1996 Ameri
can Institute of Physics.