Aa. Golubov et al., PROPERTIES OF LATERAL NB CONTACTS TO A 2-DIMENSIONAL ELECTRON-GAS IN AN IN0.77GA0.23AS INP HETEROSTRUCTURE/, Physical review. B, Condensed matter, 54(23), 1996, pp. 17018-17028
We have measured the differential resistance of lateral Nb contacts to
a two-dimensional electron gas (2DEG) in an InP/InxGa1-xAs heterostru
cture. The I-V curves show strong deviations from the frequently used
model developed by Blonder, Tinkham, and Klapwijk. In all samples the
maximum of conductance at about eV=Delta(0) is damped and shifted to l
ower voltages. Depending on the surface cleaning procedure two differe
nt regimes are observed. We will present two models that allow one to
interpret the conductance mechanisms. The parameters used in the model
s are within a realistic range given by characteristic material values
. In the case of wet chemically cleaned samples the 2DEG is assumed to
be in the clean limit. To describe the measurement results of these s
amples we assume a proximity effect in a Nb oxide layer (N) located be
tween the Nb (S) and the 2DEG causing the shift of the conductance max
imum. Pair-breaking processes in the SN electrode are responsible for
the damping of this maximum. Additionally we include the proximity eff
ect between the electrode and the 2DEG in our model. When the semicond
uctor surface is cleaned by Ar ions, the 2DEG is damaged at the surfac
e. For this case we have shown that an additional voltage drop occurs
in this disturbed part of the 2DEG and that the inelastic scattering i
n the SN electrode is stronger than in the case of the wet chemically
cleaned samples.