IN-SITU SINGLE-CRYSTAL X-RAY-DIFFRACTION STUDY OF CRYSTALLIZATION KINETICS IN CLATHRASIL DODECASIL-3C

Authors
MORRIS RE WEIGEL SJ NORBY P HANSON JC CHEETHAM AK
Citation
Re. Morris et al., IN-SITU SINGLE-CRYSTAL X-RAY-DIFFRACTION STUDY OF CRYSTALLIZATION KINETICS IN CLATHRASIL DODECASIL-3C, Journal of synchrotron radiation, 3, 1996, pp. 301-304
Citations number
12
Categorie Soggetti
Instument & Instrumentation","Physics, Applied",Optics
Journal title
Journal of synchrotron radiation → ACNP
ISSN journal
09090495
Volume
3
Year of publication
1996
Part
6
Pages
301 - 304
Database
ISI
SICI code
0909-0495(1996)3:<301:ISXSOC>2.0.ZU;2-X
Abstract
The formation of single crystals of the clathrasil dodecasil-3C from a solvothermal synthesis has been followed by in situ diffraction techn iques using synchrotron radiation and an image-plate area detector. Th e high intensity of the X-ray beam, coupled with the ability to record time-resolved two-dimensional data using the image plates, allowed th e crystallization kinetics to be studied and rate expressions to be fi tted to the crystallization curves.