CHARACTERISTICS OF HARD X-RAY-EMISSION FROM SUBPICOSECOND LASER-PRODUCED PLASMAS

Citation
M. Schnurer et al., CHARACTERISTICS OF HARD X-RAY-EMISSION FROM SUBPICOSECOND LASER-PRODUCED PLASMAS, Journal of applied physics, 80(10), 1996, pp. 5604-5609
Citations number
11
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
80
Issue
10
Year of publication
1996
Pages
5604 - 5609
Database
ISI
SICI code
0021-8979(1996)80:10<5604:COHXFS>2.0.ZU;2-Z
Abstract
Calibrated thermoluminescence dosimeters have been used to measure the angular and spectral dependence of hard x-ray emission produced from intense subpicosecond laser irradiation of solid targets. A dosimeter detector set with nine filter channels (13.5-400 keV) has been tested successfully. Total bremsstrahlung conversion up to 0.23% and conversi on of 8X10(-5) from laser energy to Ta K alpha line emission (photon e nergy approximate to 57 keV) was determined. The scaling of the hard x -ray yield with laser intensities ranging from 3X10(16) to 3X10(18) W/ cm(2) was investigated. (C) 1996 American Institute of Physics.