Or. Monteiro et al., CHEMICAL-VAPOR-DEPOSITION OF SILICON-NITRIDE IN A MICROWAVE PLASMA-ASSISTED REACTOR, Journal of Materials Science, 31(22), 1996, pp. 6029-6033
Microwave plasma assisted chemical vapour deposition was used to produ
ce silicon nitride films on silicon substrates from mixtures of methan
e and nitrogen. Deposition temperatures varied from 800 to 1000 degree
s C and pressure varied from 53.2 to 79.8 x 10(2) Pa. Gas mixtures wit
h low methane content resulted in no reaction. Gas mixtures with high
methane content produced an amorphous carbon film on the silicon wafer
surface. At intermediate methane contents, the process produces a mix
ture of alpha and beta silicon nitride. A mechanism is proposed accord
ing to which the silicon surface is chemically etched by the activated
methyl radicals forming Si(CH3)(4), which then reacts with nitrogen a
toms (or ions) to form the silicon nitride. The morphology of the indi
vidual crystals evolves from platelets to needle-like depending on the
deposition conditions, and on the surface coverage of the silicon sur
face.