CHEMICAL-VAPOR-DEPOSITION OF SILICON-NITRIDE IN A MICROWAVE PLASMA-ASSISTED REACTOR

Citation
Or. Monteiro et al., CHEMICAL-VAPOR-DEPOSITION OF SILICON-NITRIDE IN A MICROWAVE PLASMA-ASSISTED REACTOR, Journal of Materials Science, 31(22), 1996, pp. 6029-6033
Citations number
14
Categorie Soggetti
Material Science
ISSN journal
00222461
Volume
31
Issue
22
Year of publication
1996
Pages
6029 - 6033
Database
ISI
SICI code
0022-2461(1996)31:22<6029:COSIAM>2.0.ZU;2-B
Abstract
Microwave plasma assisted chemical vapour deposition was used to produ ce silicon nitride films on silicon substrates from mixtures of methan e and nitrogen. Deposition temperatures varied from 800 to 1000 degree s C and pressure varied from 53.2 to 79.8 x 10(2) Pa. Gas mixtures wit h low methane content resulted in no reaction. Gas mixtures with high methane content produced an amorphous carbon film on the silicon wafer surface. At intermediate methane contents, the process produces a mix ture of alpha and beta silicon nitride. A mechanism is proposed accord ing to which the silicon surface is chemically etched by the activated methyl radicals forming Si(CH3)(4), which then reacts with nitrogen a toms (or ions) to form the silicon nitride. The morphology of the indi vidual crystals evolves from platelets to needle-like depending on the deposition conditions, and on the surface coverage of the silicon sur face.