PIEZORRESISTIVITY OF CERMET THIN SOLID FI LMS

Authors
ARAGON R ALONSO P BROITMAN E PASCUET MI ZIMMERMAN R
Citation
R. Aragon et al., PIEZORRESISTIVITY OF CERMET THIN SOLID FI LMS, Anales de la Asociacion Quimica Argentina, 83(6), 1995, pp. 373-377
Citations number
7
Categorie Soggetti
Chemistry
Journal title
Anales de la Asociacion Quimica Argentina → ACNP
ISSN journal
03650375
Volume
83
Issue
6
Year of publication
1995
Pages
373 - 377
Database
ISI
SICI code
0365-0375(1995)83:6<373:POCTSF>2.0.ZU;2-W
Abstract
The electrical resistivity and strain gauge factor of Cr-SiOx cermet t hin films are examined. Piezorresistivity is restricted by composition and thickness, which determine the range of bidimensional discrete co nducting island behaviour, and its value is sensitive to the differenc e in Young modulus of the dielectric and metallic phases.