X-RAY-DIFFRACTION STUDIES ON CHEMICALLY PREPARED CDS1-XSEX THIN-FILMS

CdS1-XSeX thin films with 0 less than or equal to x less than or equal to 1 were deposited onto the amorphous glass slides using a chemical deposition technique. The films have been characterised by an X-ray di ffraction technique and the diffractograms are analysed to test the po ssibility of formation of solid solution. CdS is deposited in both cub ic and hexagonal forms whereas CdSe in the hexagonal phase only. Forma tion of solid solution takes place for the values of x ranging between 0 less than or equal to x less than or equal to 0.4 and 0.85 less tha n or equal to x less than or equal to 1. For the middle range (0.4 < x < 0.85), a mixture of CdS, CdSe and CdS1-xSex phases have been observ ed. Only the hexagonal phase undergoes solid solution while the cubic phase remains uninfluenced. For the hexagonal phase, lattice parameter s increase with increasing and obey Vegard's law in the solid solution range.