T. Shima et al., INPLANE PHOTOCONDUCTIVITY OF INAS GAAS STRAINED-LAYER STRUCTURES PREPARED ON VARIOUSLY ORIENTED GAAS SUBSTRATES/, Applied surface science, 107, 1996, pp. 233-237
Citations number
10
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Photoconductivity (PC) measurements were employed to investigate the p
hotoelectric properties of InAs/GaAs strained-layer structure grown on
GaAs (100), (311)A and (111)A substrates. PC results of the sample gr
own on GaAs (311)A and (111)A substrates showed specific PC signals at
lower energy region (around 1.2 eV) from GaAs band-edge. From transie
nt PC measurement varying the sample temperature, activation energies
of around 0.19 eV were obtained for the sample grown on (311)A substra
te with 1 monolayer of InAs. These activation energies suggest the exi
stence of relatively thick InAs region that are locally formed and/or
specific defects formed in the samples grown on highly oriented substr
ates.