NEUTRON-DIFFRACTION ANALYSIS OF ND2FE17NX - A REEXAMINATION

Authors
HU Z YELON WB
Citation
Z. Hu et Wb. Yelon, NEUTRON-DIFFRACTION ANALYSIS OF ND2FE17NX - A REEXAMINATION, Journal of applied physics, 80(11), 1996, pp. 6175-6178
Citations number
15
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
80
Issue
11
Year of publication
1996
Pages
6175 - 6178
Database
ISI
SICI code
0021-8979(1996)80:11<6175:NAON-A>2.0.ZU;2-P
Abstract
A sample of Nd2Fe17Nx previously studied has been remeasured with high er-resolution powder neutron diffraction. Rietveld analysis confirms t he existence of two values of x. The higher x corresponds to nearly fu ll occupation of the octahedral 9e site, while the lower value corresp onds to partial occupancy of both the octahedral and tetrahedral 18g s ites by nitrogen. The lattice changes for both compositions have been carefully examined. (C) 1996 American Institute of Physics.