A STOCHASTIC-MODEL FOR CRYSTAL-AMORPHOUS TRANSITION IN LOW-TEMPERATURE MOLECULAR-BEAM EPITAXIAL SI(111)

Citation
R. Venkatasubramanian et al., A STOCHASTIC-MODEL FOR CRYSTAL-AMORPHOUS TRANSITION IN LOW-TEMPERATURE MOLECULAR-BEAM EPITAXIAL SI(111), Journal of applied physics, 80(11), 1996, pp. 6219-6222
Citations number
10
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
80
Issue
11
Year of publication
1996
Pages
6219 - 6222
Database
ISI
SICI code
0021-8979(1996)80:11<6219:ASFCTI>2.0.ZU;2-M
Abstract
Molecular beam epitaxial Si (111) grown below a certain temperature re sult in amorphous structure due to the limited surface mobility of ato ms in finding correct epitaxial sites. In spite of many experimental a nd theoretical studies, the mechanism of crystal-amorphous transition and its dynamics related to the growth conditions are not well underst ood. In this article, we present a theoretical model based on the form ation of stacking fault like defects as a precursor to the amorphous t ransition of the layer. The model is simulated based on a stochastic m odel approach and the results are compared to that of experiments for temperatures in the range of 500-900 K and growth rate in the range of 0.1-3.0 Angstrom/s. The agreement between our results and experimenta l observations is excellent. (C) 1996 American Institute of Physics.