Jm. Rommel et al., PHOTOLUMINESCENCE MEASUREMENT OF THE FACET TEMPERATURE OF 1 W GAIN-GUIDED ALGAAS GAAS LASER-DIODES/, Journal of applied physics, 80(11), 1996, pp. 6547-6549
The output facet temperature of high-power AlGaAs/GaAs single quantum
well (SQW) laser diodes was measured during operation. The front outpu
t facets were passivated with Al2O3 coatings. The spectral shift of ph
otoluminescence from the cladding layers was used to determine the tem
perature rise at the front facet with increasing output power. The spa
tial resolution of the technique allowed to look at each cladding laye
r individually and to study the correlation between the near-field pat
tern and the temperature profile along the active layer. The local tem
perature on the facet at 1 W total optical power (corresponding to an
average linear power density of 10 mW/mu m) was found to vary between
25 and 45 K above the average active layer temperature and to exceed t
he heat-sink temperature by up to 70 K. This represents a significant
reduction of facet temperature in comparison to earlier reports and ca
n be attributed to high-quality passivation coatings. (C) 1996 America
n Institute of Physics.