Azobenzene monolayers on silicon have been prepared by two synthetic m
ethods: (1) chemisorption of triethoxysilanes, and (2) acylation of am
ine-functionalized self-assembled monolayers with acid chloride deriva
tives. A series of films were prepared with different methylene spacer
lengths and different, terminal end groups (pentyl vs hydrogen). The
resulting films were characterized using water contact angles, X-ray p
hotoelectron spectroscopy, attenuated total reflectance infrared spect
roscopy, and X-ray reflectivity (XR). Despite evidence for successful
attachment of azobenzene to the surfaces, film thicknesses as determin
ed by XR suggest uniform, but incomplete, monolayers. Irradiation of t
he films with 354 nm light effected a decrease in the water contact an
gle. The largest photoinduced changes in contact angles (9 degrees) we
re observed for films prepared by acylation and with terminal pentyl g
roups; for one of these films, XR monitoring of film thicknesses showe
d a 1 Angstrom increase in film thickness during 354 nm irradiation.