MICRORAMAN ANALYSIS OF TWIN LAMELLAE IN UNDOPED LEC INP

Authors
MARTIN P JIMENEZ J MARTIN E TORRES A GONZALEZ MA RAMOS J
Citation
P. Martin et al., MICRORAMAN ANALYSIS OF TWIN LAMELLAE IN UNDOPED LEC INP, Journal of materials science. Materials in electronics, 5(6), 1994, pp. 315-320
Citations number
18
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
Journal title
Journal of materials science. Materials in electronics → ACNP
ISSN journal
09574522
Volume
5
Issue
6
Year of publication
1994
Pages
315 - 320
Database
ISI
SICI code
0957-4522(1994)5:6<315:MAOTLI>2.0.ZU;2-2
Abstract
A {221} twin lamella in undoped LEC InP was studied by means of a dilu ted sirtl mixture applied with fight (DSL) photoetching and microRaman spectroscopy. This study revealed that there was defect segregation a t the twin boundary. This boundary-defect-depletion area would result in an enhanced photocarrier lifetime and a stress relaxation that exte nds a few micrometres away the boundary. From these results, it appear s that the formation of this twin was strongly influenced by stoichiom etry fluctuations during growth; these fluctuations were revealed by b oth selective photoetching and by microRaman scanning spectroscopy.