We describe a set-up for monitoring the dynamics of the processes at t
he surface of HTSC samples treated by a pulsed laser. Using a He-Ne la
ser and a detecting system we monitored the surface reflectivity chang
es. The targets treated - pure single-phase YBCO, and a sample with tr
aces of Rb2O on the grain boundaries showed changes in the microwave s
urface resistance and the critical current density.