EVIDENCE FOR SURFACE MELTING DURING THE GROWTH OF HIGH T-C THIN-FILMS

Authors
CHANDRASEKHAR N SCHLOM DG
Citation
N. Chandrasekhar et Dg. Schlom, EVIDENCE FOR SURFACE MELTING DURING THE GROWTH OF HIGH T-C THIN-FILMS, Physica. C, Superconductivity, 235, 1994, pp. 697-698
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
Physica. C, Superconductivity → ACNP
ISSN journal
09214534
Volume
235
Year of publication
1994
Part
1
Pages
697 - 698
Database
ISI
SICI code
0921-4534(1994)235:<697:EFSMDT>2.0.ZU;2-5
Abstract
We present reflection high energy electron diffraction (RHEED) spot pr ofile analyses, which show anomalous broadening over very short time s cales. Our data can only be interpreted in terms of surface melting. T he conclusions are consistent with the thermodynamic phase diagrams an d with the vapor-liquid-solid (VLS) mechanism of crystal growth.