T. Yamaguchi et al., INPLANE ALIGNED Y1BA2CU3O7-X TAPES ON METALLIC SUBSTRATE BY CHEMICAL-VAPOR-DEPOSITION TECHNIQUE, JPN J A P 1, 33(11), 1994, pp. 6150-6156
In-plane aligned Y1Ba2Cu3O7-x thin-film tapes have been prepared by th
e chemical vapor deposition technique on a metallic substrate at 700 d
egrees C. For continuous deposition on a long substrate, tetrahydrofur
an solution of Y, Ba and Cu beta-diketonate chelate was slowly introdu
ced to a vaporizer with argon gas by a liquid flow controller. The gen
erated gas, including source metals, was carried to a reactor with oxy
gen. The orientation-controlled Y1Ba2Cu3O7-x thin-film tapes could be
obtained by this system on a Hastelloy C-276 substrate with an in-plan
e aligned yttrium-stabilized zirconia buffer layer. The critical tempe
rature defined by zero resistance was 88.5 K and the critical current
density at 77 K in 0 T was 2.74 x 10(4) A/cm(2).