THE USE OF FAR-INFRARED ELLIPSOMETRY IN THE STUDY OF HIGH-TEMPERATURESUPERCONDUCTORS - POSSIBILITIES AND LIMITATIONS

Authors
KAMARAS K VANDERMAREL D HOMES CC TIMUSK T
Citation
K. Kamaras et al., THE USE OF FAR-INFRARED ELLIPSOMETRY IN THE STUDY OF HIGH-TEMPERATURESUPERCONDUCTORS - POSSIBILITIES AND LIMITATIONS, Physica. C, Superconductivity, 235, 1994, pp. 1085-1086
Citations number
6
Categorie Soggetti
Physics, Applied
Journal title
Physica. C, Superconductivity → ACNP
ISSN journal
09214534
Volume
235
Year of publication
1994
Part
2
Pages
1085 - 1086
Database
ISI
SICI code
0921-4534(1994)235:<1085:TUOFEI>2.0.ZU;2-1
Abstract
We examine the possibilities of applying spectroscopic ellipsometry fo r the determination of the far-infrared dielectric function of high te mperature superconductors. On the example of YBa2Cu3O7 at 20 K we show that the potential of the method lies in the accurate determination o f epsilon(1) rather than the details of the onset of epsilon(2).