Measurements of electrical resistance and thermoelectric power (TEP) o
f sputtered (B0.8Pb0.2)(2)Sr2Ca2Cu3O10+delta thin films on MgO have be
en carrier out. The thermopower is positive for nearly single phase fi
lms in the measured interval of temperature (77K-300K) and fits well t
o an expression of the form S=AT+B/T. In other type of films variation
s of the slope sign and changes of the TEP magnitude at the room tempe
rature have been observed, which we related to the presence of defects
such as phase mixture.