The transverse magnetoresistance Delta rho/rho(B,T)=(rho(B,T)-rho(0,T)
)/rho(0,T) of epitaxial UPd2Al3 thin films with various defect densiti
es has been measured in the temperature range from 2K to 35K and in ma
gnetic fields up to 12T. Whereas in films with low defect densities De
lta rho/rho for ($) under bar B parallel to ($) under bar c shows a st
rong positive magnetoresistance (up to 15% at (12T,2K)) due to the for
mation of a coherent band of heavy quasiparticles, we find a negative
magnetoresistance in films with high defect concentration which is exp
ected for a Kondo system in the incoherent regime. For ($) under bar B
perpendicular to ($) under bar c a local maximum in the (B,T)-plane o
f Delta rho/rho can be resolved near (4T,6K).