THE DEFECT STRUCTURE AND THE CRITICAL-CURRENT DENSITY OF A HIGHLY TEXTURED YBA2CU3O7 THIN-FILM

Citation
S. Senoussi et al., THE DEFECT STRUCTURE AND THE CRITICAL-CURRENT DENSITY OF A HIGHLY TEXTURED YBA2CU3O7 THIN-FILM, Physica. C, Superconductivity, 235, 1994, pp. 2767-2768
Citations number
5
Categorie Soggetti
Physics, Applied
ISSN journal
09214534
Volume
235
Year of publication
1994
Part
4
Pages
2767 - 2768
Database
ISI
SICI code
0921-4534(1994)235:<2767:TDSATC>2.0.ZU;2-N
Abstract
we have carrierd out comparative investigations of the ''critical'' cu rrent density and the microstructure of several highly textured thin f ilms of YBa2Cu3O7, using Transmission Electron Microscopy. We find tha t the very high current density (7x10(11)(A/m(2)) at H=0 and T=4.2K) c annot be explained by the observed microstructure. A mechanism based o n intrinsic pinning and demagnetization is proposed.