X-RAY-DIFFRACTION PROFILES IN STRAINED CRYSTALS UNDERGOING ULTRASONICEXCITATION - THE LAUE CASE

Citation
E. Zolotoyabko et B. Sander, X-RAY-DIFFRACTION PROFILES IN STRAINED CRYSTALS UNDERGOING ULTRASONICEXCITATION - THE LAUE CASE, Acta crystallographica. Section A, Foundations of crystallography, 51, 1995, pp. 163-171
Citations number
38
Categorie Soggetti
Crystallography
ISSN journal
01087673
Volume
51
Year of publication
1995
Part
2
Pages
163 - 171
Database
ISI
SICI code
0108-7673(1995)51:<163:XPISCU>2.0.ZU;2-#
Abstract
A new approach for the calculation of diffraction profiles in strained crystals is developed, based on the visual concepts of the dispersion surface and Poynting vectors. By this approach, analytical expression s have been obtained for diffraction profiles for the case of a consta nt strain gradient without, as well as with, ultrasonic excitation. Ca lculations of acoustically induced modifications in diffraction spectr a explain in detail the anomalous dependence of integrated intensity o n ultrasound amplitude, a dependence that was recently found in the La ue scattering geometry.