YBA2CU3O7 FILMS EPITAXIALLY GROWN ON MGO, LAALO3, SRLAALO4 AND AL2O3 SUBSTRATES - STRUCTURAL AND SUPERCONDUCTING PROPERTIES IN CORRELATION WITH THE MICROWAVE SURFACE-RESISTANCE AND THE FAR-INFRARED TRANSMITTANCE
C. Lepaventhivet et al., YBA2CU3O7 FILMS EPITAXIALLY GROWN ON MGO, LAALO3, SRLAALO4 AND AL2O3 SUBSTRATES - STRUCTURAL AND SUPERCONDUCTING PROPERTIES IN CORRELATION WITH THE MICROWAVE SURFACE-RESISTANCE AND THE FAR-INFRARED TRANSMITTANCE, Physica. C, Superconductivity, 244(3-4), 1995, pp. 231-242
YBa2Cu3O7 epitaxial films have been grown by laser ablation on MgO, La
AlO3, SrLaAlO4 and Al2O3 substrates. Films on LaAlO3 have excellent st
ructural, superconducting and microwave properties, reflected by surfa
ce-resistance (R(S)) values systematically in the range 0.5-1 m Omega
(10 GHz, 77 K). On MgO substrates, such low R, (< 0.50 m Omega) values
can be reached on both fully ''normal-0 degrees'' and ''45 degrees''
in-plane oriented YBa2Cu3O7 films, whereas in mixed (0 degrees-45 degr
ees) films the presence of the high-angle grain boundaries leads to a
surface resistance larger than 100 m Omega. On SrLaAlO4 and bare Al2O3
substrates, despite good superconducting properties, obtained for sap
phire due to the specific substrate surface treatment, the structural
quality and surface resistance are moderate. The latter results are in
complete agreement with the correlation we have demonstrated between
structural quality and surface resistance as well as far-infrared tran
smittance. We also point out the importance of a R(S) determination as
an intrinsic superconducting parameter: the absence of a direct corre
lation with low-frequency measurements shows that the latter are not s
ufficient to fully characterize the superconducting thin films.