X-RAY RAMAN-SCATTERING AS A MEANS FOR STUDIES OF NEAR-EDGE AND EXTENDED X-RAY-ABSORPTION FINE-STRUCTURES

The use of elastic and inelastic resonant X-ray scattering opens new p ossibilities for studies of near-edge and extended X-ray absorption fi ne structures. We demonstrate that NEXAFS and EXAFS spectra measured i n the X-ray Raman mode can be obtained at ultra-high resolution, that they can provide new information on symmetries of core-excited states (NEXAFS) and on bond angles and internuclear distances for disordered systems (EXAFS). The latter feature contrasts ordinary EXAFS technique s which give information only on internuclear distances.